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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic Emission Spectroscopy: Instrumentation01:22

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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When solids, liquids, or condensed gases are heated sufficiently, they radiate some of the excess energy as light. Photons produced in this manner have a range of energies, and thereby produce a continuous spectrum in which an unbroken series of wavelengths is present.
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Meter-scale spark X-ray spectrum statistics.

B E Carlson1, N Østgaard2, P Kochkin3

  • 1Department of PhysicsCarthage CollegeKenoshaWisconsinUSA; Birkeland Center for Space ScienceUniversity of BergenBergenNorway.

Journal of Geophysical Research. Atmospheres : JGR
|November 22, 2016
PubMed
Summary
This summary is machine-generated.

This study statistically analyzes X-ray spectra from high-voltage sparks, revealing an exponential energy distribution and power-law fluence. These findings help elucidate the underlying bremsstrahlung process in spark discharges.

Keywords:
X‐raybremsstrahlunglightningsparkspectrum

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Area of Science:

  • Physics
  • Plasma Physics
  • High-Voltage Engineering

Background:

  • X-ray emission from electrical sparks is attributed to electron bremsstrahlung, but the precise mechanisms are not fully understood.
  • Understanding this process is crucial for applications involving high-voltage discharges and radiation generation.

Purpose of the Study:

  • To statistically analyze X-ray spectra from high-voltage sparks.
  • To determine the parameters of the X-ray energy distribution and spark X-ray fluence distribution.

Main Methods:

  • Detailed statistical analysis of X-ray spectra from over 900 high-voltage spark events.
  • Utilizing multiple detectors to capture X-ray signals from 1 MV negative pulses with 1 μs risetime.
  • Fitting cumulative distribution functions to observed data to determine distribution parameters.

Main Results:

  • The X-ray energy spectrum after traversing air and aluminum shielding is best described by an exponential distribution with a mean of 86 ± 7 keV.
  • The distribution of spark X-ray fluence follows a power law with an index of -1.29 ± 0.04.
  • The power-law distribution spans at least three orders of magnitude in fluence, indicating a wide range of emission intensities.

Conclusions:

  • The study successfully models the X-ray emission from sparks using statistical distributions.
  • The findings provide quantitative parameters for the bremsstrahlung process in high-voltage sparks.
  • This research contributes to a deeper understanding of radiation generation in transient electrical discharges.