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Atomically Thin Graphene Windows That Enable High Contrast Electron Microscopy without a Specimen Vacuum Chamber.
Yimo Han1, Kayla X Nguyen2, Yui Ogawa2,3
1Department of Applied and Engineering Physics, Cornell University , Ithaca, New York 14853, United States.
Nano Letters
|December 15, 2016
Summary
The airSEM allows scanning electron microscopy (SEM) imaging in ambient air by removing the vacuum chamber. Using bilayer graphene windows significantly improves image quality and signal-to-noise ratio in this novel SEM configuration.
Area of Science:
- Materials Science
- Physics
- Electron Microscopy
Background:
- Scanning electron microscopes (SEMs) traditionally require high vacuum, limiting specimen types.
- Electron scattering in air at SEM voltages has a mean free path (MFP) of 50-100 μm.
- Existing airSEM designs are limited by scattering from silicon nitride windows.
Purpose of the Study:
- To develop an improved airSEM by replacing silicon nitride windows with graphene.
- To assess the impact of graphene windows on imaging contrast and resolution in an airSEM.
- To enhance the signal-to-noise ratio for various SEM imaging modes.
Main Methods:
- Demonstrated the use of a robust bilayer graphene window to seal electron optics from the environment.
- Compared imaging performance of the airSEM with graphene windows to traditional vacuum SEM and SEM with silicon nitride windows.
- Evaluated contrast, resolution, and signal-to-noise ratio in backscattered, transmission, and surface imaging modes.
Main Results:
- Bilayer graphene windows provided an electron-transparent barrier with only a 2% drop in contrast.
- Achieved a 5-fold increase in signal/noise ratio compared to multi-MFP-thick silicon nitride windows.
- Comparable imaging quality to all-vacuum SEM was maintained.
Conclusions:
- Bilayer graphene windows are a viable solution for enabling high-quality SEM imaging in ambient air.
- The airSEM with graphene windows overcomes limitations of previous designs, expanding possibilities for in-situ and ambient SEM analysis.
- This advancement facilitates high-contrast imaging across multiple SEM modes without a full vacuum environment.
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