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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Atomic Emission Spectroscopy: Instrumentation01:22

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Single-atom detection of light elements: Imaging or spectroscopy?

Ryosuke Senga1, Kazu Suenaga1

  • 1Nano-Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan.

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|March 5, 2017
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Summary
This summary is machine-generated.

Researchers developed a new method for detecting hard-to-see light atoms like Lithium, Oxygen, and Fluorine using scanning transmission electron microscopy (STEM). This technique improves atomic-scale imaging and spectroscopy for materials science applications.

Keywords:
Light elementLow voltageOne-dimensional materialSTEM-EELSSingle-atom detection

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Aberration-corrected scanning transmission electron microscopy (STEM) enables single-atom imaging at lower voltages (~60kV).
  • Current STEM methods can detect light elements (B, C, N) in 2D materials, reducing beam damage.
  • Visualizing individual atoms of Li, O, and F remains challenging due to weak contrast and signal overlap.

Purpose of the Study:

  • To demonstrate the successful detection of difficult-to-visualize light elements (Li, O, F) at the atomic level.
  • To overcome the limitations of conventional STEM imaging for specific light elements.
  • To advance atomic-scale spectroscopy techniques for materials analysis.

Main Methods:

  • Utilizing aberration-corrected scanning transmission electron microscopy (STEM).
  • Employing spectroscopy mode for enhanced signal detection.
  • Optimizing imaging conditions for low-voltage electron microscopy (~60kV).

Main Results:

  • Achieved successful detection of individual atoms of Li, O, and F.
  • Demonstrated the capability of spectroscopy mode to overcome weak contrast issues.
  • Provided atomic-scale visualization of previously 'hardly visible' elements.

Conclusions:

  • The developed spectroscopy-based STEM method enables atomic resolution for challenging light elements.
  • This advancement expands the scope of single-atom analysis in materials science.
  • The technique offers new possibilities for characterizing light elements in advanced materials.