Related Experiment Video
Updated: Mar 6, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Simulation in elemental mapping using aberration-corrected electron microscopy
1School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.
Abstract:
Elemental mapping at the atomic scale in aberration-corrected electron microscopes is becoming increasingly widely used. In this paper we describe the essential role of simulation in understanding the underlying physics and thus in correctly interpreting these maps, both qualitatively and quantitatively.
More Related Videos
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy
Transmission Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy

