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Quantifying X-Ray Fluorescence Data Using MAPS
Published on: February 17, 2018
Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay
Zhiliang Gong1, Daniel Kerr2, Hyeondo Luke Hwang1
1James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA.
The Review of Scientific Instruments
|April 5, 2017
Summary
A new software package, XeRay, enables accurate analysis of total reflection x-ray fluorescence (TXRF) data for layered systems. It accurately quantifies ion concentrations at interfaces, aiding chemical element distribution studies.
Area of Science:
- Materials Science
- Analytical Chemistry
- Surface Science
Background:
- Total reflection x-ray fluorescence (TXRF) is a sensitive technique for analyzing chemical element distributions in layered structures.
- Existing TXRF data analysis methods can be complex and time-consuming.
Purpose of the Study:
- To develop a user-friendly software package for accurate and efficient TXRF data analysis.
- To facilitate scientific discovery by simplifying the interpretation of TXRF data.
Main Methods:
- Development of XeRay, a MATLAB-based software with a graphical user interface for TXRF data analysis.
- Modeling of layered systems with independent chemical composition and thickness for each layer.
- Fine-tuned data fitting capabilities within the XeRay software.
Main Results:
- XeRay accurately analyzed TXRF data from air/liquid and liquid/liquid interfaces.
- Quantified Ca2+ sequestration at a SOPA Langmuir monolayer, revealing a 1:1 ratio with SOPA headgroups.
- Determined Sr2+ enrichment at the dodecane/surfactant/water interface, consistent with literature values.
Conclusions:
- XeRay provides a quick, accurate, and intuitive tool for TXRF data analysis.
- The software is effective for studying ion distributions at various interfaces.
- XeRay promotes scientific advancement in fields utilizing TXRF analysis.
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