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The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO2-Based RRAM and Applications for Pattern

Zheng Zhou1, Chen Liu1, Wensheng Shen1

  • 1Institute of Microelectronics, Peking University, Beijing, 100871, China.

Summary

A novel resistive-switching random access memory (RRAM) device enables binary spike-time-dependent plasticity (STDP) for neuromorphic computing. This RRAM-based STDP system successfully performs unsupervised online handwritten digit recognition.

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