SUT-NANOTEC-SLRI beamline for X-ray absorption spectroscopy

Area of Science:

• Materials Science
• Nanotechnology
• Synchrotron Radiation

Background:

• The Synchrotron Light Research Institute (SLRI) established the SUT-NANOTEC-SLRI beamline in 2012.
• This facility is a joint venture between Suranaree University of Technology (SUT), National Nanotechnology Center (NANOTEC), and SLRI.
• It serves as a key resource for synchrotron utilization and advanced materials analysis.

Purpose of the Study:

• To detail the design and capabilities of the SUT-NANOTEC-SLRI intermediate-energy X-ray absorption spectroscopy (XAS) beamline.
• To demonstrate the beamline's performance through experimental validation.
• To showcase its utility for analyzing a range of materials using XAS techniques.

Main Methods:

• Construction and characterization of an intermediate-energy XAS beamline with tunable photon energy (1.25-10 keV).
• Utilizing an unfocused monochromatic X-ray beam with specific flux and beam size parameters.
• Acquiring K-edge X-ray Absorption Near Edge Structure (XANES) and Extended X-ray Absorption Fine Structure (EXAFS) spectra.

Main Results:

• The beamline delivers tunable photon energies from 1.25 to 10 keV.
• Characterization confirmed beam properties including flux and size suitable for XAS.
• Successful acquisition of K-edge XANES spectra for MgO, Al2O3, S8, FeS, FeSO4, Cu, Cu2O, and CuO.
• EXAFS spectra for Cu and CuO were also obtained, validating the beamline's capabilities.

Conclusions:

• The SUT-NANOTEC-SLRI beamline is a well-characterized facility for XAS research.
• Its performance is suitable for detailed materials characterization using XANES and EXAFS.
• The presented data demonstrate the beamline's effectiveness for diverse applications in materials science and nanotechnology.