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Spectralon spatial depolarization: towards an intrinsic characterization using a novel phase shift distribution
Optics Express
|May 5, 2017
Summary
Accurately characterizing spectralon spatial depolarization is crucial for low reflectance samples. This study proposes a new method using polarimetric imaging to determine the degree of polarization (DOP) based on reflectance.
Area of Science:
- Radiometry and Polarimetry
- Optical Engineering
- Materials Science
Background:
- Spectralons are essential radiometric reference samples with calibrated reflectance.
- Characterizing the degree of polarization (DOP) of scattered light from low reflectance samples is challenging.
- Spatial depolarization in spectralons affects radiometric measurements.
Purpose of the Study:
- To propose an accurate method for determining the spatial depolarization of spectralons.
- To establish a relationship between reflectance and the degree of polarization (DOP) of scattered light.
- To analyze the statistical distribution of polarization states in scattered light.
Main Methods:
- Utilizing a spatially resolved polarimetric imaging system to capture pixel-wise polarization states.
- Performing statistical distribution analysis on the polarization data across the entire image.
- Analyzing the relative phase shift distribution between orthogonal electric field components.
Main Results:
- The relative phase shift distribution shows high sensitivity to sample reflectance, following a circular Voigt profile.
- The intrinsic spatial depolarization is linked to the circular Cauchy contribution of phase dispersion.
- An analytic equation was derived to estimate spatially integrated DOP as a function of reflectance.
Conclusions:
- The proposed method accurately determines spectralon spatial depolarization, even for low reflectance samples.
- The study provides a new analytic equation for estimating DOP based on reflectance.
- This work enhances the understanding and characterization of polarization effects in radiometric measurements.
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