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EELS at very high energy losses
Ian MacLaren1, Kirsty J Annand1, Colin Black1
1School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
Microscopy (Oxford, England)
|October 17, 2017
Summary
High-performance electron energy-loss spectroscopy (EELS) now provides excellent data up to 5 keV for chemical analysis and atomic ordering studies. This advanced technique also yields quality results for high energy losses, exceeding 9 keV.
Area of Science:
- Materials Science
- Spectroscopy
- Analytical Chemistry
Background:
- Electron energy-loss spectroscopy (EELS) is a powerful technique for materials analysis.
- Improving high-energy loss performance in EELS is crucial for advanced applications.
Purpose of the Study:
- To investigate and enhance the high loss performance of EELS.
- To demonstrate the utility of optimized EELS for chemical and structural analysis at high energy losses.
Main Methods:
- Utilized an optimized optical coupling between the microscope and spectrometer.
- Acquired EELS data in the 2 to >10 keV range.
- Studied oxidation in Zr, Mo, and Sn, and analyzed Ti-K and W L3 edges.
Main Results:
- Achieved excellent data quality up to approximately 5 keV for energy loss near edge structure (ELNES) and extended energy loss fine structure (EXELFS) studies.
- Demonstrated high-quality EELS data acquisition for energy losses above 9.2 keV, including the tungsten L3 edge at 10.2 keV.
- Successfully applied ELNES for oxidation state analysis and EXELFS for local atomic ordering.
Conclusions:
- Optimized optical coupling significantly improves high loss performance in EELS.
- High-quality EELS data is now accessible for detailed chemical and structural investigations across a wider energy range.
- This advancement expands the applicability of EELS in materials characterization.