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Updated: Feb 19, 2026

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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
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Simultaneous dual-wavelength off-axis flipping digital holography.
Optics Letters
|November 1, 2017
Summary
We present a novel two-wavelength off-axis digital holography technique for quantitative phase imaging. This method enables rapid phase and thickness measurements from a single interferogram shot, simplifying complex optical setups.
Area of Science:
- Optics and Photonics
- Biomedical Imaging
- Materials Science
Background:
- Quantitative phase imaging (QPI) is crucial for label-free microscopy.
- Traditional QPI methods often require complex setups or multiple measurements.
- Developing faster and simpler QPI techniques is essential for broader applications.
Purpose of the Study:
- To develop a simplified two-wavelength off-axis digital holography system for QPI.
- To achieve quantitative phase and thickness measurements from a single interferogram.
- To demonstrate a robust and easily alignable holographic setup.
Main Methods:
- Implemented a two-wavelength off-axis digital holography setup.
- Utilized beam flipping for interference and polarization modulation for spatial multiplexing.
- Employed a single-shot interferogram acquisition on a CCD camera.
- Developed algorithms for extracting two-wavelength unwrapped phase and thickness information.
Main Results:
- Successfully extracted phase and thickness information from a single interferogram.
- Demonstrated the technique's capability with a step target and circular pillar.
- Achieved straightforward alignment without requiring pinholes, gratings, or dichroic mirrors.
Conclusions:
- The developed two-wavelength digital holography system offers efficient and simplified QPI.
- Single-shot acquisition and straightforward alignment make the technique practical for various applications.
- This method advances label-free imaging by providing rapid and accurate phase and thickness measurements.

