Multipoint scanning dual-detection confocal microscopy for fast 3D volumetric measurement

D Lee1,2, D-G Gweon1, H Yoo3

  • 1Nano Opto-Mechatronics Laboratory, Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea.

Journal of Microscopy
|December 19, 2017
PubMed
Summary

A novel multipoint scanning dual-detection confocal microscopy (MS-DDCM) system enables rapid 3D surface profiling without axial scanning. This advanced microscopy technique offers high-speed measurements with enhanced contrast and accuracy, even on varied surfaces.