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A 532 nm fiber-optic displacement interferometer for low-velocity impact experiments
Chaoqun Jiang1, Yang Li1, Qiancheng Liu1
1The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610031, People's Republic of China.
The Review of Scientific Instruments
|March 3, 2018
Summary
A new fiber-optic Doppler pin system operating at 532 nm improves low-velocity measurements, overcoming limitations of conventional 1550 nm interferometers. This system enhances temporal and velocity resolution for impact experiments.
Area of Science:
- Optics and Photonics
- Materials Science
- Experimental Physics
Background:
- Conventional fiber-optic displacement interferometers at 1550 nm exhibit limitations in temporal and velocity resolution for low-velocity measurements.
- Accurate measurement of low velocities is crucial in various scientific and engineering applications, including impact studies.
Purpose of the Study:
- To develop and demonstrate a novel fiber-optic Doppler pin system capable of overcoming the resolution limitations of existing technologies for low-velocity measurements.
- To validate the performance of the new system using low-velocity plate impact experiments.
Main Methods:
- Development of a fiber-optic Doppler pin system operating at a shorter wavelength (532 nm).
- Experimental validation using plate impact tests designed to generate low velocities.
- Comparison of performance metrics (temporal and velocity resolution) against conventional interferometers.
Main Results:
- The developed 532 nm fiber-optic Doppler pin system successfully demonstrated enhanced temporal and velocity resolution for low-velocity measurements.
- The system proved effective in characterizing low-velocity plate impact events.
- Performance metrics indicate a significant improvement over conventional 1550 nm systems for this specific application.
Conclusions:
- The novel fiber-optic Doppler pin system offers a viable solution for high-resolution low-velocity measurements.
- This instrument serves as a valuable supplement to existing measurement systems, expanding their applicability.
- The 532 nm system shows promise for advanced diagnostics in dynamic impact studies.
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