Related Experiment Video
Updated: Feb 10, 2026

High-definition Fourier Transform Infrared FT-IR Spectroscopic Imaging of Human Tissue Sections towards Improving Pathology
Published on: January 21, 2015
Evaluation of Silicon Wafer-Based Internal Reflection Elements for Use with in Situ Fourier Transform Infrared
Brent A Sperling1, Berc Kalanyan1
1National Institute of Standards and Technology, Gaithersburg, MD, USA.
Abstract:
Silicon wafer-based internal reflection elements (IREs) present many practical advantages over the prisms conventionally used for attenuated total reflection (ATR) spectroscopy in the infrared. We examine two methods of using minimally prepared IREs that have appeared in the literature, edge-coupled (EC) and prism-coupled (PC), in conjunction with a liquid flow cell. Polarization measurements show that radiation entering the PC-IRE becomes depolarized due to stress-induced birefringence, and transmission through the edge of the EC-IRE also affects the polarization state. Quantification of the noise and a calibration using a series of sodium acetate solutions show the sensitivity of the PC-IRE outweighs the lower noise obtainable with the EC-IRE.
More Related Videos
Related Concept Videos
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
The ATR process begins by directing a beam...
Fast Fourier Transform
The computational efficiency of the FFT becomes...
Properties of Fourier Transform I
In radio broadcasting, multiple audio signals often need to be transmitted simultaneously. The Fourier...
Properties of Fourier Transform II
The Frequency Shifting property of Fourier Transforms highlights that a shift in the frequency domain corresponds to a phase shift in the time domain. Mathematically, if x(t) has...
Discrete Fourier Transform
Basic signals of Fourier Transform
The sinc function, defined as sinc(x) = sin(πx)/(πx), is particularly notable for its symmetry and behavior at...

