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Updated: Feb 9, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Transmission Electron Microscope Nanosculpting of Topological Insulator Bismuth Selenide
Sarah E Friedensen1, William M Parkin1, Jerome T Mlack1
1Department of Physics and Astronomy , University of Pennsylvania , Philadelphia , Pennsylvania 19104 , United States.
Abstract:
We present a process for sculpting Bi2Se3 nanoflakes into application-relevant geometries using a high-resolution transmission electron microscope. This process takes several minutes to sculpt small areas and can be used to cut the Bi2Se3 into wires and rings, to thin areas of the Bi2Se3, and to drill circular holes and lines. We determined that this method allows for sub 10 nm features and results in clean edges along the drilled regions. Using in situ high-resolution imaging, selected area diffraction, and atomic force microscopy, we found that this lithography process preserves the crystal structure of Bi2Se3. TEM sculpting is more precise and potentially results in cleaner edges than does ion-beam modification; therefore, the promise of this method for thermoelectric and topological devices calls for further study into the transport properties of such structures.
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