An improved contrast equalization technique for contrast enhancement in scanning electron microscopy images

Area of Science:

• Microscopy
• Image Processing
• Materials Science

Background:

• Scanning electron microscopy (SEM) generates high-resolution images crucial for biology and medicine.
• SEM images often suffer from low contrast due to device limitations, hindering detailed analysis.
• Existing contrast enhancement methods may not fully address the specific challenges of SEM image degradation.

Purpose of the Study:

• To propose an improved contrast equalization technique specifically designed for SEM images.
• To enhance the visual quality and diagnostic utility of degraded SEM images.
• To provide a robust solution for overcoming low-contrast effects in electron microscopy.

Main Methods:

• A novel two-phase technique involving regularization and mapping processes.
• Phase one: A two-step regularization process to normalize image intensities.
• Phase two: A two-step mapping process for contrast improvement and dynamic range restoration.

Main Results:

• The proposed technique effectively ameliorates contrast in SEM images.
• Demonstrated superior performance compared to six established contrast enhancement methods.
• Achieved visually pleasing results with no artifacts and high accuracy scores.

Conclusions:

• The developed contrast equalization technique significantly enhances SEM image quality.
• It offers a valuable tool for researchers requiring clear and detailed electron microscopy imagery.
• The method outperforms existing techniques in both visual perception and quantitative metrics.