In situ metrology for adaptive x-ray optics with an absolute distance measuring sensor array.

V G Badami1, E Abruña1, L Huang2

  • 1Zygo Corporation, 21 Laurel Brook Road, Middlefield, Connecticut 06455, USA.

Summary

This study introduces a new method for real-time measurement of adaptive x-ray mirror shapes using interferometric sensors. This non-disruptive technique ensures high accuracy for advanced x-ray light sources.

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