Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale...

Area of Science:

• Materials Science
• Nanotechnology
• Physics

Background:

• Understanding local structure-property relationships is crucial for advanced materials.
• Simultaneous nanoscale characterization of electronic and crystallographic properties is challenging.
• Existing techniques often lack the resolution or multimodal capabilities needed.

Purpose of the Study:

• To report the design, implementation, and operating procedures of a novel multimodal imaging instrument.
• To demonstrate the instrument's capability for simultaneous nanoscale characterization.
• To investigate local structure-property relationships at the nanoscale.

Main Methods:

• Integration of scanning near-field optical microscopy (SNOM) with nanofocused synchrotron X-ray diffraction (XRD) imaging.
• Development of an in situ mechanical pressure application system using a scanning tip.
• Multimodal data acquisition and correlation of optical and structural information.

Main Results:

• Successful development and operation of a multimodal imaging instrument.
• Demonstration of nanoscale characterization of electronic/optical properties and crystallographic structure.
• Proof-of-principle study of the insulator-metal phase transition in samarium sulfide (SmS) under mechanical pressure.
• Correlation of near-field optical reflectivity with heterogeneous structural transformations in SmS.

Conclusions:

• The developed multimodal instrument enables simultaneous nanoscale characterization of optical and structural properties.
• The instrument facilitates the investigation of local structure-property relationships.
• This approach is effective for studying phase transitions and material transformations at the nanoscale.