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Updated: Jan 19, 2026

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Published on: September 14, 2018
Design for a 10 keV multi-pass transmission electron microscope
Stewart A Koppell1, Marian Mankos2, Adam J Bowman1
1Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, CA 94305, USA.
Multi-pass transmission electron microscopy (MPTEM) reduces radiation damage to sensitive samples. This technique allows for fewer images to build 3D models in cryo-electron microscopy (cryo-EM), improving imaging of challenging specimens.
Area of Science:
- Electron microscopy
- Materials science
- Biophysics
Background:
- Radiation damage limits imaging of sensitive materials in electron microscopy.
- Cryo-electron microscopy (cryo-EM) requires numerous projections for 3D reconstruction.
- Imaging low-contrast and heterogeneous samples remains challenging.
Purpose of the Study:
- To design and demonstrate a proof-of-concept multi-pass transmission electron microscope (MPTEM).
- To reduce radiation dose to samples by increasing electron-sample interactions.
- To enable 3D reconstruction with fewer projections for cryo-EM applications.
Main Methods:
- Development of a 10 keV MPTEM instrument.
- Incorporation of fast-switching gated electron mirrors for multiple electron passes.
- Derivation of a linear approximation for the multi-pass contrast transfer function (CTF).
Main Results:
- Successful design and implementation of a functional MPTEM.
- Demonstrated capability for electrons to interact with the sample multiple times.
- Developed a theoretical framework relating resolution to the number of passes.
Conclusions:
- MPTEM offers a promising approach to mitigate radiation damage in electron microscopy.
- The developed MPTEM design can potentially reduce imaging dose and data requirements for cryo-EM.
- Further theoretical and experimental validation is needed to optimize MPTEM performance.
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