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Published on: October 9, 2012
Zeeman Effect in Positronium Annihilation at Low Temperatures
William C Sauder1, Richard D Deslattes1
1Institute for Materials Research, National Bureau of Standards, Washington, D.C. 20234.
Positronium annihilation in helium near its critical point, under a magnetic field, can precisely measure the electron's Compton wavelength. This method offers a wavelength determination beyond the one part per million level using existing technology.
Area of Science:
- Atomic Physics
- Quantum Electrodynamics
- Metrology
Background:
- Positronium annihilation is a key process in quantum electrodynamics.
- Precise measurement of fundamental constants like the electron's Compton wavelength is crucial for testing physical theories.
- Previous methods for Compton wavelength determination have limitations in precision.
Purpose of the Study:
- To investigate the potential of positronium annihilation for highly precise electron Compton wavelength measurements.
- To calculate the spectral line shape of annihilation radiation under specific experimental conditions.
- To explore the feasibility of achieving sub-parts-per-million accuracy.
Main Methods:
- Calculation of the spectral line shape for positronium thermalized in helium gas near its critical point.
- Application of a magnetic field to achieve a specific three-photon to two-photon decay branching ratio for the S0 component.
- Inclusion of an exact solution for the Zeeman effect in positronium.
Main Results:
- Narrow spectral distributions of annihilation radiation are achievable due to rapid thermalization and long triplet state lifetimes.
- The proposed method allows for the production of spectral distributions suitable for high-precision measurements.
- The study confirms the theoretical basis for achieving high accuracy in Compton wavelength determination.
Conclusions:
- Positronium annihilation provides a viable pathway for precise electron Compton wavelength measurements.
- A wavelength determination accuracy beyond the one part per million level is attainable with current technology.
- This research opens avenues for enhanced metrology in fundamental physics.
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