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Control system for the new RIKEN 28-GHz superconducting electron cyclotron resonance ion source for SRILAC
A Uchiyama1, T Nagatomo1, Y Higurashi1
1Nishina Center for Accelerator Based Science, RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198, Japan.
A new superconducting electron cyclotron resonance ion source (SC-ECRIS) enhances the SRILAC accelerator. Its control system uses advanced programmable logic controllers (PLCs) for improved reliability and scalability.
Area of Science:
- Nuclear Physics and Accelerator Technology
- Control Systems Engineering
Background:
- The RIKEN linear accelerator (SRILAC) requires advanced ion sources for enhanced performance.
- Previous control systems faced limitations in reliability and scalability.
Purpose of the Study:
- To introduce a new 28-GHz superconducting electron cyclotron resonance ion source (SC-ECRIS) for the SRILAC.
- To develop a robust and scalable control system for the new SC-ECRIS.
Main Methods:
- Installation of a new 28-GHz SC-ECRIS.
- Implementation of a control system using programmable logic controllers (PLCs) with Experimental Physics and Industrial Control System.
- Integration of sequential and Linux PLC central processing units for enhanced reliability.
- Utilizing star-topology field buses for rapid and cost-effective system scalability.
- Development of a unique 920-MHz-band radio data acquisition system for analog measurements.
Main Results:
- Successful installation and integration of the new SC-ECRIS.
- Demonstrated improved reliability through dual PLC CPU architecture.
- Achieved rapid and cost-effective system scalability via star-topology field buses.
- Successfully measured analog data, including high-voltage stage temperature, using the novel radio-based acquisition system.
Conclusions:
- The new SC-ECRIS and its control system significantly enhance the SRILAC's capabilities.
- The implemented control architecture ensures high reliability and adaptability for future upgrades.
- The novel data acquisition system provides effective monitoring of critical parameters.
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