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Weighted Mobility.

G Jeffrey Snyder1, Alemayouh H Snyder2, Maxwell Wood1

  • 1Department of Materials Science and Engineering, Northwestern University, Evanston, IL, 60208, USA.

Advanced Materials (Deerfield Beach, Fla.)
|May 16, 2020
PubMed
Summary
This summary is machine-generated.

A new method simplifies calculating weighted mobility using Seebeck coefficient and electrical resistivity. This technique accurately measures charge carrier mobility in semiconductors at higher temperatures and lower values, crucial for device engineering.

Keywords:
electrical measurementselectrical transportmobilityorganic semiconductorsphotovoltaicssemiconductorsthermoelectrics

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Area of Science:

  • Materials Science
  • Solid-State Physics
  • Semiconductor Engineering

Background:

  • Accurate charge carrier mobility is essential for engineering semiconductor devices.
  • Traditional methods like Hall effect and resistivity measurements are limited to specific temperature ranges and mobility values.
  • Advancements in measurement systems now allow for the determination of weighted mobility.

Purpose of the Study:

  • To introduce a simple method for calculating weighted mobility from Seebeck coefficient and electrical resistivity measurements.
  • To enable accurate mobility assessment at room temperature and above, and for lower mobility materials.
  • To provide a tool for elucidating electronic structure and scattering mechanisms in materials.

Main Methods:

  • Utilized combined Seebeck coefficient and electrical resistivity measurement systems.
  • Developed a straightforward calculation for weighted mobility (μw) using the formula: μw = (kB/e) * (σ/S) * T-1.
  • Validated the method for materials with mobilities as low as 10-3 cm2 V-1 s-1.

Main Results:

  • The proposed method provides accurate weighted mobility values at room temperature and above.
  • Successfully measured low mobilities down to 10-3 cm2 V-1 s-1.
  • Demonstrated the utility of weighted mobility analysis in understanding material properties.

Conclusions:

  • The new method offers a practical approach to determine weighted mobility, expanding the capabilities of standard measurements.
  • Weighted mobility analysis is a valuable technique for characterizing semiconductors and optimizing thermoelectric systems.
  • This approach facilitates a deeper understanding of electronic transport and scattering phenomena in diverse materials.