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Characterization of Uniformity in Nb/NbxSi1-x/Nb Josephson Junctions

Ian W Haygood1, Eric R J Edwards2, Anna E Fox3

  • 1Department of Physics, University of Colorado, Boulder, CO 80309 USA.

IEEE Transactions on Applied Superconductivity : a Publication of the IEEE Superconductivity Committee
|December 7, 2020
PubMed
Abstract

Keywords:
Josephson arraysprocess controlsuperconducting device testingthin-film devices

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