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Comparison between Graphene and GaAs Quantized Hall Devices with a Dual Probe
Shamith U Payagala1, Albert F Rigosi1, Alireza R Panna1
1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
IEEE Transactions on Instrumentation and Measurement
|December 18, 2020
Summary
This study compares graphene and GaAs quantum Hall resistance (QHR) devices for precision measurements. Results show graphene
Area of Science:
- Metrology
- Condensed Matter Physics
- Materials Science
Background:
- Quantum Hall resistance (QHR) provides a fundamental resistance standard.
- Gallium Arsenide (GaAs) based QHR devices are the established standard.
- Graphene offers potential for next-generation, user-friendly quantum standards.
Purpose of the Study:
- To compare the performance of a graphene QHR device against a GaAs QHR device.
- To evaluate a novel dual probe apparatus for precision resistance measurements.
- To assess the tunability of graphene's charge carrier density for metrological applications.
Main Methods:
- Fabrication of a graphene QHR device at NIST and a GaAs QHR device at NRC.
- Comparison of devices using a cryogenic current comparator against a 1 kΩ standard resistor.
- Utilizing a custom-developed dual probe for simultaneous measurements.
Main Results:
- Successful comparison of graphene and GaAs QHR devices.
- Demonstration of controllable charge carrier density tuning in graphene via annealing after Cr(CO)3 functionalization.
- Validation of the dual probe's viability for precision measurements.
Conclusions:
- Graphene QHR devices are viable for resistance comparisons with established GaAs devices.
- The developed dual probe is suitable for precision measurements using multiple quantum standards.
- Graphene's tunability and potential for user-friendly equipment advancement are highlighted.
