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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy01:25

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Differential electron yield imaging with STXM.

William A Hubbard1, Jared J Lodico1, Xin Yi Ling1

  • 1Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA.

Ultramicroscopy
|January 22, 2021
PubMed
Summary
This summary is machine-generated.

Differential electron yield (DEY) imaging, a new scanning transmission X-ray microscopy (STXM) method, maps device connectivity without electric fields. This technique visualizes electron and hole sensitivity, aiding in understanding device function and failure.

Keywords:
Electron yieldFailure analysisSTXMScanning transmission X-ray microscopyTEYXBIC

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Total electron yield (TEY) imaging in scanning transmission X-ray microscopy (STXM) provides contrast based on sample geometry, composition, and conductivity.
  • TEY-STXM signal is limited to ejected electrons.
  • X-ray beam-induced current (XBIC) imaging detects electrons and holes but necessitates electric fields.

Purpose of the Study:

  • Introduce differential electron yield (DEY) contrast for STXM.
  • Develop a method sensitive to electrons and holes without requiring electric fields.
  • Demonstrate DEY-STXM's utility in mapping device connectivity and failure analysis.

Main Methods:

  • Utilized multi-electrode devices wired to generate DEY contrast.
  • Applied STXM with DEY contrast to image a stressed aluminum nanowire.
  • Analyzed DEY-STXM signal variations based on electrode connectivity.

Main Results:

  • DEY contrast changes sign depending on the illuminated region's connection to electrodes.
  • DEY-STXM successfully mapped the connectivity landscape of the aluminum nanowire.
  • The technique visualized failure in the aluminum nanowire after high current density stress.

Conclusions:

  • DEY-STXM offers a novel approach to visualize device connectivity landscapes.
  • This method is valuable for understanding device function and identifying failure mechanisms.
  • DEY-STXM serves as a powerful tool for failure analysis in nanoscale devices.