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Microfluidic Platform with Multiplexed Electronic Detection for Spatial Tracking of Particles

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Microchip Health Monitoring System Using the FLL Circuit.

Emmanuel Bender¹, Joseph B Bernstein¹

¹Department of Electrical and Electronic Engineering, Ariel University, Ariel 40700, Israel.

Sensors (Basel, Switzerland)

|April 3, 2021

Summary

This summary is machine-generated.

A novel Microchip Health Monitoring (MHM) system simplifies end-of-life (EOL) predictions by tracking frequency degradation. This system leverages Multi-Temperature Operational Life (MTOL) data and a unique Frequency Locked Loop (FLL) circuit for early and accurate chip health assessment.

Keywords:

BTI FPGA failure mechanisms prognostics reliability prediction

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Area of Science:

Electrical Engineering
Materials Science
Reliability Engineering

Background:

Modern microchips exhibit a dominant failure mechanism, simplifying degradation analysis.
Existing monitoring systems may not accurately predict end-of-life (EOL) for advanced integrated circuits.
Reliability testing, such as Multi-Temperature Operational Life (MTOL), provides crucial data for performance assessment.

Purpose of the Study:

To propose a novel Microchip Health Monitoring (MHM) system for accurate EOL prediction.
To leverage MTOL reliability testing data for enhanced chip health assessment.
To develop a simplified monitoring solution for contemporary FPGA and ASIC devices.

Main Methods:

A new Frequency Locked Loop (FLL) circuit combining Ring Oscillator (RO) and Phase Locked Loop (PLL) concepts was designed.
The MHM system monitors microchip frequency degradation over time against laboratory-tested data.
Weibull distribution analysis was applied to frequency degradation data from ring circuits.

Main Results:

The proposed MHM system demonstrates simplified development due to a single dominant failure mechanism.
Frequency degradation data from ring circuits formed steep-sloped Weibull distributions.
The system enables accurate EOL predictions even at early stages of chip degradation.

Conclusions:

The novel FLL-based MHM system offers accurate and early EOL predictions for microchips.
This monitoring approach is highly beneficial for systems utilizing FPGA and ASIC technologies.
The simplified design and accurate predictions enhance the reliability and longevity of electronic systems.