Validity of point-mass model in off-resonance dynamic atomic force microscopy.

Shatruhan Singh Rajput1, Surya Pratap S Deopa1, V J Ajith1

  • 1Department of Physics, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.

Nanotechnology
|June 18, 2021
PubMed
Summary

The point-mass model for atomic force microscopy (AFM) cantilevers is adequate for measuring nano-scale viscoelasticity in liquids, provided experiments are conducted carefully in the off-resonance regime with high cantilever stiffness.