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Study the Electrical Properties of Surface Mount Device Integrated Silver Coated Vectran Yarn
Abdella Ahmmed Simegnaw1,2, Benny Malengier1, Melkie Getnet Tadesse2
1Department of Materials, Textiles and Chemical Engineering, Faculty of Engineering and Architecture, Ghent University, B-9052 Ghent, Belgium.
Researchers developed a new smart textile yarn by integrating electronic components. This silver-coated Vectran E-yarn shows significant changes in electrical resistance due to various external factors, paving the way for advanced wearable electronics.
Area of Science:
- Materials Science
- Electrical Engineering
- Textile Engineering
Background:
- Smart textiles integrate electronic components into fabrics for enhanced functionality.
- Current methods for integrating Surface Mounted Electronic Devices (SMD) into conductive yarns face challenges like short-circuit vulnerability.
- Limited research exists on the electro-mechanical characterization of SMD-integrated smart yarns.
Purpose of the Study:
- To investigate the effects of external factors on the electrical resistance of SMD-integrated silver-coated Vectran (SCV) E-yarn.
- To determine optimal construction methods for robust smart textile yarns.
- To evaluate the potential of SCV E-yarns for wearable conductive tracks and sensors.
Main Methods:
- Fabrication of a Vectran E-yarn by integrating an SMD resistor into a silver-coated Vectran yarn using vapor phase reflow soldering.
- Systematic testing of the E-yarn's electrical resistance under varying conditions: strain, solder pad size, temperature, abrasion, and washing.
- Characterization of the electro-mechanical properties of the developed E-yarn.
Main Results:
- Electrical resistance of the SCV E-yarn is significantly influenced by conductive gauge length, strain, solder pad size, temperature, abrasion, and washing.
- An E-yarn constructed with SCV conductive thread and a 68 Ω SMD resistor exhibited maximum electrical resistance (72.16 Ω) and power (0.29 W) per 0.31 m length.
- The study identified key factors affecting the reliability and performance of integrated electronic yarns.
Conclusions:
- The developed SCV E-yarn demonstrates a significant relationship between its electrical properties and various external environmental and mechanical stresses.
- The fabrication method and characterization provide valuable insights for designing durable and functional smart textiles.
- This research offers a promising foundation for the manufacturing of advanced wearable conductive tracks and sensors.
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