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Updated: Sep 29, 2025

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
Published on: January 19, 2020
Oleksandr Buchnev1, James A Grant-Jacob1, Robert W Eason1
1Optoelectronics Research Centre, University of Southampton, Highfield, Southampton SO17 1BJ, United Kingdom.
Deep learning accurately predicts focused ion beam (FIB) milling outcomes, accelerating micro- and nanofabrication. This AI approach reduces trial-and-error, improving process optimization and reproducibility for FIB applications.
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