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Ultrahigh-resolution optical vector analyzer for multiple parallel measurements based on frequency-domain analysis.

Bin Wang, Xinyu Fan, Shuangxiang Zhao

    Optics Letters
    |April 29, 2022
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces an ultrahigh-resolution optical vector analyzer (OVA) for simultaneous multi-device characterization using frequency-domain analysis (FDA). The novel OVA achieves high resolution, fast measurement times, and a wide frequency range for optical spectral response analysis.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Spectroscopy

    Background:

    • Accurate and efficient characterization of optical devices is crucial for advancements in various fields.
    • Existing methods for optical spectral response analysis often lack the capability for simultaneous multi-device measurements or high resolution.

    Purpose of the Study:

    • To develop and demonstrate an ultrahigh-resolution optical vector analyzer (OVA).
    • To enable multiple parallel measurements of optical devices using frequency-domain analysis (FDA).
    • To achieve simultaneous characterization with high frequency resolution, fast measurement speed, and a broad frequency range.

    Main Methods:

    • Generation of an optical linearly frequency-modulated waveform via electro-optic modulation and optical injection locking.
    • Utilizing an unbalanced Mach-Zehnder interferometer (MZI) with cascaded devices under test (DUTs) and a delay reference line.
    • Employing a balanced photo-detector to generate electrical signals and applying frequency-domain analysis (FDA) for spectral response extraction.

    Main Results:

    • Simultaneous characterization of a hydrogen cyanide (HCN) gas cell, a phase-shifted fiber Bragg grating, and an optical reflector.
    • Achieved a frequency resolution as high as 200 kHz.
    • Demonstrated a measurement time as short as 490 µs and a frequency measurement range as wide as 18.5 GHz.

    Conclusions:

    • The proposed optical vector analyzer (OVA) successfully enables simultaneous characterization of multiple optical devices.
    • The system offers ultrahigh resolution, rapid measurement capabilities, and a wide frequency range, advancing optical metrology.
    • This technique provides a powerful tool for analyzing the spectral responses of diverse optical components and systems.