MOS Capacitor
Metal-Semiconductor Junctions
MOSFET: Enhancement Mode
Biasing of Metal-Semiconductor Junctions
Characteristics of MOSFET
Non-ohmic Devices
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Updated: Sep 5, 2025

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Tsz-Lung Ho1, Keda Ding1, Nikolay Lyapunov1
1Department of Applied Physics, The Hong Kong Polytechnic University, Hong Kong, China.
This study demonstrates multilevel resistive switching in tin selenide/strontium titanate (SnSe/STO) heterojunction memristive devices. These devices show reliable, stable switching, paving the way for advanced non-volatile memory and neuromorphic computing applications.
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