CONFOCAL X-RAY FLUORESCENCE ANALYSIS OF SAMPLES FORMED FROM HOMOGENEOUS LAYERS: COMPARISON OF SIMULATIONS WITH

Kateřina Limburská1, Tomáš Trojek1

  • 1Czech Technical University in Prague, Department od Dosimetry and Application of Ionizing Radiation, Břehová 7, 155 19 Prague, Czech Republic.

Summary

A new simplified calculation procedure accurately determines elemental depth distribution using confocal X-ray fluorescence analysis. This method precisely models depth profiles in layered materials, validated with NIST 1412 glass.