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Updated: Aug 31, 2025

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
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CONFOCAL X-RAY FLUORESCENCE ANALYSIS OF SAMPLES FORMED FROM HOMOGENEOUS LAYERS: COMPARISON OF SIMULATIONS WITH
Kateřina Limburská1, Tomáš Trojek1
1Czech Technical University in Prague, Department od Dosimetry and Application of Ionizing Radiation, Břehová 7, 155 19 Prague, Czech Republic.
Radiation Protection Dosimetry
|August 25, 2022
Summary
A new simplified calculation procedure accurately determines elemental depth distribution using confocal X-ray fluorescence analysis. This method precisely models depth profiles in layered materials, validated with NIST 1412 glass.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Confocal X-ray fluorescence (CXRF) analysis is a non-destructive technique for elemental depth distribution analysis.
- Accurate determination of elemental depth profiles from measured data is challenging due to a lack of standardized procedures.
Purpose of the Study:
- To design and validate a universal, simplified calculation procedure for determining elemental depth profiles.
- To enable approximate depth profile calculations for layered samples with known thickness and composition.
Main Methods:
- Development of a simplified calculation procedure for depth profile analysis.
- Application and testing of the procedure using confocal X-ray fluorescence (CXRF) measurements.
- Validation using the standard reference material NIST 1412 (homogeneous multicomponent glass).
Main Results:
- The developed calculation procedure allows for the approximate determination of elemental depth profiles.
- Comparison of measured and calculated depth profiles in NIST 1412 showed near-perfect correspondence.
- The method effectively models depth distributions in layered materials.
Conclusions:
- The proposed simplified calculation procedure is effective for analyzing elemental depth distribution.
- This method provides a reliable approach for characterizing layered materials using CXRF.
- The study validates the procedure's accuracy and universality.

