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Updated: Aug 26, 2025

Accumulation and Analysis of Cuprous Ions in a Copper Sulfate Plating Solution
Published on: March 20, 2019
Cu(II) and Hg(II) detection under photo-assisted accumulation in an open circuit potential at a polyazulene-EDTA like
Cristian Pirvu1, Gabriela Stanciu2, George-Octavian Buica1
1Faculty of Chemical Engineering and Biotechnologies, University Politehnica of Bucharest, 1-7 Gheorghe Polizu St, Bucharest, 011061, Romania. buica_george@yahoo.com.
Abstract:
The influence of UV light irradiation on the metal ion open-circuit accumulation process is determined using a glassy carbon modified electrode with poly(2,2'-(ethan-1,2-diylbis((2-(azulen-2-ylamino)-2-oxoethyl)azandiyl))diacetic acid (polyL). A correlation analysis between the semiconductive properties of polyL film and sensing properties is performed. Photo-assisted metal ion open circuit accumulation led to the simultaneous detection of Cu(II) and Hg(II) which allowed a detection limit of 0.4 nM and 0.7 nM for Cu(II) and Hg(II), respectively.
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