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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
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Embedded micro-probe fiber optic interferometer with low nonlinearity against light intensity disturbance.
Optics Express
|October 12, 2022
Summary
A new Michelson fiber interferometer minimizes errors from light intensity changes. This fiber optic sensor achieves sub-nanometer displacement accuracy for embedded measurements.
Area of Science:
- Optics and Photonics
- Metrology
- Fiber Optic Sensing
Background:
- High-precision displacement measurements are crucial for embedded systems.
- Light intensity fluctuations can significantly degrade the accuracy of fiber optic interferometers.
- Existing methods struggle to compensate for environmental disturbances like varying light intensity.
Purpose of the Study:
- To introduce a novel low-nonlinearity Michelson microprobe fiber interferometer.
- To analyze the impact of light intensity disturbance on measurement accuracy.
- To develop a robust method for high-precision embedded displacement detection.
Main Methods:
- Established an equivalent model for micro-probe sensing with a tilted target.
- Developed a Phase Generated Carrier (PGC) demodulation technique.
- Implemented a nonlinearity correction method to mitigate light intensity effects.
Main Results:
- The proposed method effectively avoids DC component variations caused by light intensity changes.
- Residual displacement errors were reduced from 4.36 nm to 0.46 nm.
- Sub-nanometer accuracy was achieved under low-frequency light intensity disturbance.
Conclusions:
- The novel Michelson microprobe fiber interferometer offers high-precision embedded displacement measurement capabilities.
- The PGC demodulation and nonlinearity correction method significantly enhances robustness against light intensity disturbances.
- This technology enables reliable sub-nanometer displacement detection in challenging environments.

