Impact ionization-induced bistability in CMOS transistors at cryogenic temperatures for capacitorless memory

A Zaslavsky1,2, C A Richter2, P R Shrestha2,3

  • 1School of Engineering, Brown University, Providence, Rhode Island 02912, USA.

Applied Physics Letters
|March 6, 2023
PubMed
Summary

Complementary metal oxide semiconductor (CMOS) transistors exhibit bistability at cryogenic temperatures due to impact ionization. This phenomenon enables novel capacitorless single-transistor memory devices for quantum information science.

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