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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Isothermal Heteroepitaxy of Ge1- Sn Structures for Electronic and Photonic Applications
Omar Concepción1, Nicolaj B Søgaard2, Jin-Hee Bae1
1Peter Gruenberg Institute 9 (PGI-9), Forschungszentrum Juelich, 52428 Juelich, Germany.
Abstract:
Epitaxy of semiconductor-based quantum well structures is a challenging task since it requires precise control of the deposition at the submonolayer scale. In the case of Ge1- Sn alloys, the growth is particularly demanding since the lattice strain and the process temperature greatly impact the composition of the epitaxial layers. In this paper, the realization of high-quality pseudomorphic Ge1- Sn layers with Sn content ranging from 6 at. % up to 15 at. % using isothermal processes in an industry-compatible reduced-pressure chemical vapor deposition reactor is presented. The epitaxy of Ge1- Sn layers has been optimized for a standard process offering a high Sn concentration at a large process window. By varying the N2 carrier gas flow, isothermal heterostructure designs suitable for quantum transport and spintronic devices are obtained.

