Quantitative phase gradient metrology using diffraction phase microscopy and deep learning

In quantitative phase microscopy, measurement of the phase gradient is an important problem for biological cell morphological studies. In this paper, we propose a method based on a deep learning approach that is capable of direct estimation of the phase gradient without the requirement of phase unwrapping and numerical differentiation operations. We show the robustness of the proposed method using numerical simulations under severe noise conditions. Further, we demonstrate the method's utility for imaging different biological cells using diffraction phase microscopy setup.