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Updated: Jul 25, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Francesco La Via1, Daniel Alquier2, Filippo Giannazzo1
1CNR-IMM, Strada VIII, 5, 95121 Catania, Italy.
Silicon carbide (SiC) is enabling new high-temperature, high-frequency, and radiation-hard applications. Further development in SiC material processing and foundries is crucial for realizing the full potential of these emerging technologies.
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