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Direct method of extracting broadband complex refractive index from spectrophotometric measurements: an application
Braden Czapla1, Leonard Hanssen1
1Sensor Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA.
Abstract:
We describe an algorithm to extract the complex refractive index of a material from broadband reflectance and transmittance measurements taken by spectrophotometers. The algorithm combines Kramers-Kronig analysis with an inversion of Fresnel's equations to provide a direct method of solving for the refractive index which is accurate, even for weakly absorbing materials, and easily applicable to radiative heat transfer calculations. The algorithm is validated by extracting the complex refractive index of polydimethylsiloxane between 0.25 microm and 100 microm and comparing against existing literature. We also discuss the importance of broadband optical properties to passive radiative cooling and details of the uncertainty analysis of the algorithm.
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