Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

10.4K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
10.4K
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

3.8K
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
3.8K
X-ray Crystallography02:18

X-ray Crystallography

24.0K
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
24.0K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Strength-ductility synergy in lightweight aluminium alloys with nano-layered fibres and core-shell nano-particles.

Nature communications·2026
Same author

Dynamical simulation of on-axis transmission Kikuchi and spot diffraction patterns, based on accurate diffraction geometry calibration.

Journal of microscopy·2026
Same author

<i>AstroECP</i>: towards more practical electron channeling contrast imaging.

Journal of applied crystallography·2026
Same author

Identifying grain boundary and intragranular pinning centres in Sm<sub>2</sub>(Co,Fe,Cu,Zr)<sub>17</sub> permanent magnets to guide performance optimisation.

Nature communications·2025
Same author

A novel Peltier based low temperature in situ nanoindentation system.

The Review of scientific instruments·2025
Same author

Overcoming Challenges in Atom Probe Tomography of Carbonate Minerals: Application of In Situ Chromium Coatings for Improved Experiment Yield.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same journal

Polyalthia Longifolia Induced Apoptosis via miR-484 Downregulation: A Multimodal In Situ Microscopy, In Vitro, and In Vivo Investigation.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Rhythmic Pattern of the Ovarian Development in Posthatching Japanese Quail (Coturnix coturnix japonica): Histological, Ultrastructural, and Immunohistochemical Study.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Postnatal Developmental Expression and Localization of Water Channel Proteins in the Rat Ovary.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Novel Hybrid Semiconductor-Cellular Standard for 3D FIB-SEM Nanotomography Analysis.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Morpho-Anatomical Characterization of the Raisin Tree, Hovenia dulcis Thunb., Utilizing Optical Light and Scanning Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same journal

Comparative Aspects of the Hemipenial Architecture of the Arabian Horned Viper Cerastes gasperettii: Macroscopic and Microscopic Analysis With Evolutionary Perspectives.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
See all related articles

Related Experiment Video

Updated: Jul 15, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

13.7K

Transmission Kikuchi Diffraction Mapping Induces Structural Damage in Atom Probe Specimens.

Baptiste Gault1,2, Heena Khanchandani1, Thoudden Sukumar Prithiv1

  • 1Department of Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, Düsseldorf 40237, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 25, 2023
PubMed
Summary
This summary is machine-generated.

Transmission Kikuchi diffraction (TKD) can damage atom probe tomography (APT) specimens. This study shows TKD mapping causes solute redistribution and void formation, creating artifacts in material analysis.

Keywords:
atom probe tomographydamageelectron backscatter diffractiontransmission Kikuchi diffraction

More Related Videos

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.8K
Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

7.4K

Related Experiment Videos

Last Updated: Jul 15, 2025

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

13.7K
Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.8K
Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

7.4K

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Electron Microscopy

Background:

  • Atom probe tomography (APT) is crucial for analyzing material chemistry at the nanoscale.
  • Transmission Kikuchi diffraction (TKD) aids in positioning samples for APT analysis.
  • Potential structural damage from TKD electron beams is not well understood.

Purpose of the Study:

  • To investigate and evidence structural damage in APT specimens caused by TKD mapping.
  • To identify the nature of the damage and its impact on solute distribution.
  • To propose a mechanism for TKD-induced specimen damage.

Main Methods:

  • Analysis of two case studies: a β-Ti-12Mo alloy and a high manganese steel.
  • Utilizing transmission Kikuchi diffraction (TKD) for specimen positioning.
  • Employing atom probe tomography (APT) to analyze specimen chemistry and structure post-TKD.

Main Results:

  • TKD mapping induced planar segregation of molybdenum in the Ti-12Mo alloy.
  • In the high manganese steel, TKD resulted in planar segregation and deuterium-filled voids (bubbles).
  • Both cases demonstrated artifacts in solute distribution due to TKD-induced damage.

Conclusions:

  • TKD mapping can introduce significant artifacts in APT analysis by altering solute distribution.
  • A proposed mechanism involves recoil implantation of surface species (H, C) by energetic electrons, causing damage cascades.
  • Careful consideration of TKD parameters is necessary to mitigate specimen damage for accurate APT results.