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    This study presents a novel polarization phase-shifting white light interferometric system (PPS-WLIS) for measuring transparent object slopes. The system simplifies phase-shift interferometry, enabling single-capture dynamic event analysis.

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    Area of Science:

    • Optical Physics
    • Metrology
    • Interferometry

    Background:

    • Phase-shift interferometry is crucial for precise optical measurements.
    • Traditional methods can be complex and require multiple captures.
    • Measuring transparent objects' slope phase presents unique challenges.

    Purpose of the Study:

    • To design and demonstrate a polarization phase-shifting white light interferometric system (PPS-WLIS).
    • To enable transmissive mode measurement of the slope phase of transparent objects.
    • To simplify phase-shift interferometry for dynamic event analysis.

    Main Methods:

    • Coupling a cyclic path interferometer with a multiplexing Michelson interferometer.
    • Utilizing polarization to generate two simultaneously modulated parallel interferograms.
    • Employing a two-step phase demodulation algorithm without requiring precise phase shifts.

    Main Results:

    • Successful observation of object variations linked to optical phase changes.
    • Demonstration of a simplified, single-capture phase-shift interferometry process.
    • Accurate temperature measurement of a candle flame section as an application.

    Conclusions:

    • The developed PPS-WLIS offers a straightforward and effective method for slope phase measurement.
    • The system's single-capture capability makes it ideal for dynamic optical event analysis.
    • This technique advances transparent object metrology and real-time optical analysis.