Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct...

Area of Science:

• Materials Science
• Crystallography
• Electron Microscopy

Background:

• Diffraction pattern analysis reveals crystalline structure crucial for advanced engineering materials.
• Transmission electron microscopy (TEM) diffraction patterns offer limited angular range, necessitating multiple pattern analyses for unit cell probing.
• Scanning electron microscopy (SEM) with on-axis detectors captures wide-angle Kikuchi patterns (Transmission Kikuchi Diffraction - TKD) for direct unit cell projection.

Purpose of the Study:

• To significantly enhance the analysis of Transmission Kikuchi Diffraction (TKD) patterns.
• To introduce a multi-exposure diffraction pattern fusion method for increased dynamic range and intensity normalization.
• To demonstrate the potential for rapid probing of nano-structured materials using SEM.

Main Methods:

• Development and application of a multi-exposure diffraction pattern fusion routine.
• Utilizing a Timepix3-based direct electron detector (DED) for data acquisition.
• Analysis of wide-angle (>95°) TKD patterns with extended dynamic range and normalized intensity.

Main Results:

• Successfully extended the dynamic range of detected diffraction patterns.
• Enabled normalization of intensity distribution within wide-angle TKD patterns.
• Demonstrated full diffraction sphere reprojection capabilities.

Conclusions:

• The multi-exposure fusion method significantly enhances TKD pattern analysis in SEM.
• This approach allows for rapid and detailed structural probing of nano-structured materials.
• The technique offers a powerful alternative for materials characterization.