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Dynamic X-ray speckle-tracking imaging with high-accuracy phase retrieval based on deep learning
Fucheng Yu1, Kang Du2, Xiaolu Ju2
1Shanghai Synchrotron Radiation Facility/Zhang Jiang Lab, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201800, People's Republic of China.
Iucrj
|December 14, 2023
Summary
A new deep-learning method enhances X-ray speckle-tracking imaging for accurate dynamic phase retrieval. This advancement overcomes limitations in traditional methods, enabling precise visualization of microstructures in materials science and biomedicine.
Area of Science:
- Advanced imaging techniques
- Materials science
- Biomedical imaging
Background:
- Speckle-tracking X-ray imaging offers flexible dynamic imaging with phase, transmission, and scattering data.
- Traditional methods exhibit phase distortion with abrupt density changes, limiting real-world sample analysis.
- Accurate phase retrieval is crucial for quantitative dynamic X-ray imaging.
Purpose of the Study:
- To develop a deep-learning based method for high-accuracy phase retrieval in dynamic X-ray speckle-tracking imaging.
- To overcome the phase distortion limitations of conventional speckle-tracking techniques.
- To enable precise quantitative analysis of dynamic processes using X-ray imaging.
Main Methods:
- Implementation of a deep-learning algorithm for X-ray speckle-tracking imaging.
- Utilizing simultaneous phase, transmission, and scattering image acquisition.
- Validation using phantom calibration and polyurethane foaming experiments.
Main Results:
- The deep-learning method achieved high-accuracy phase retrieval, consistent with theoretical profiles in phantom tests.
- Accurate visualization of complex bubble microstructure evolution during polyurethane foaming was demonstrated.
- The proposed technique effectively mitigates phase distortion issues inherent in traditional methods.
Conclusions:
- The developed deep-learning approach provides a promising solution for dynamic X-ray imaging with accurate phase retrieval.
- This method significantly enhances the application scope of speckle-tracking X-ray imaging.
- Potential for extensive applications in metrology and quantitative dynamic analysis across material science, physics, chemistry, and biomedicine.

