Metalens for Accelerated Optoelectronic Edge Detection under Ambient Illumination.

Shuai Wang1,2, Liu Li1, Shun Wen1

  • 1State Key Laboratory for Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China.

Nano Letters
|December 18, 2023
PubMed
Summary

This study presents a novel metalens-assisted imaging system for low-power optoelectronic edge detection under ambient light. The system uses polarization multiplexing for efficient image processing, enabling real-time object detection and classification.

Related Concept Videos