Unveiling the Inner Structure of Micrometric Hollow Polymeric Fibers Using Synchrotron X-Ray Nanotomography

Area of Science:

• Materials Science
• Polymer Science
• Nanotechnology

Background:

• Characterizing the intricate structure of hollow polymeric fibers is crucial for understanding their properties.
• Traditional methods often lack the resolution or comprehensive analysis capabilities for complex fiber morphologies.

Purpose of the Study:

• To present a novel application of synchrotron X-ray nanotomography for detailed structural and morphological characterization of hollow polymeric fibers.
• To assess key morphological parameters such as diameter, wall thickness, pore size, and porosity.

Main Methods:

• Utilized high-resolution full-field transmission X-ray microscopy with synchrotron X-ray nanotomography.
• Employed open-source software (Tomviz, ImageJ) for post-image analysis.
• Analyzed data using both 3D tomographic reconstruction and 2D radiographic projection-based approaches.

Main Results:

• Successfully characterized micrometric hollow polymeric fibers, including submicrometric features.
• Quantified critical parameters like fiber diameter, wall thickness distribution, pore size, porosity, and surface roughness.
• Demonstrated the technique's ability to provide comprehensive internal and external morphological insights.

Conclusions:

• Synchrotron X-ray nanotomography provides unparalleled capabilities for analyzing hollow fiber morphology.
• This technique offers unique advantages over existing methods for detailed structural assessment.
• The study highlights the potential for advanced characterization of porous materials.