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Updated: Jul 4, 2025

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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
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Preface to the special issue on Microscopy of Semiconducting Materials 2023
Thomas Walther1, Rachel A Oliver2
1Department of Electronic & Electrical Engineering, University of Sheffield, Sheffield, UK.
Journal of Microscopy
|January 29, 2024
Abstract
No abstract available in PubMed .

