Depth-enhanced high-throughput microscopy by compact PSF engineering

Nadav Opatovski1, Elias Nehme2,3, Noam Zoref2

  • 1Russell Berrie Nanotechnology Institute, Technion - Israel Institute of Technology, Haifa, Israel.

PubMed
Summary

This study introduces compact point spread function (PSF) engineering for high-throughput microscopy, enabling 3D imaging from single snapshots. This innovation reduces scanning, photobleaching, and photodamage in cellular model screening.