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Related Concept Videos

Types of Semiconductors01:20

Types of Semiconductors

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Intrinsic semiconductors are highly pure materials with no impurities. At absolute zero, these semiconductors behave as perfect insulators because all the valence electrons are bound, and the conduction band is empty, disallowing electrical conduction. The Fermi level is a concept used to describe the probability of occupancy of energy levels by electrons at thermal equilibrium. In intrinsic semiconductors, the Fermi level is positioned at the midpoint of the energy gap at absolute zero. When...
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Biasing of Metal-Semiconductor Junctions01:27

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Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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Strong third-order nonlinearity in amorphous silicon carbide waveguides.

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    Amorphous silicon carbide (a-SiC) thin films show promise for photonic devices. Increasing the refractive index of a-SiC enhances its nonlinear properties, offering a wider bandgap alternative to silicon for on-chip optical applications.

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    Area of Science:

    • Materials Science
    • Photonics
    • Nonlinear Optics

    Background:

    • Silicon carbide (SiC) is a promising material for photonic integrated circuits due to its excellent optical properties.
    • Amorphous silicon carbide (a-SiC) thin films on insulator (a-SiCOI) are accessible for wafer-scale photonic applications.
    • a-SiC offers a wider bandgap than silicon, potentially reducing two-photon absorption.

    Purpose of the Study:

    • To investigate the relationship between refractive index and nonlinear properties in a-SiC thin films.
    • To evaluate a-SiC as a material for high-performance on-chip optical applications.
    • To compare the nonlinear performance of a-SiC with silicon and crystalline SiC.

    Main Methods:

    • Fabrication of three a-SiCOI samples with varying refractive indices using plasma-enhanced chemical vapor deposition.
    • Fabrication of optical waveguides on the a-SiCOI samples.
    • Characterization of nonlinear refractive index using four-wave mixing measurements.

    Main Results:

    • An increase in the refractive index of a-SiC directly correlates with an enhanced nonlinear refractive index.
    • The nonlinear refractive index of a-SiC is comparable to that of silicon.
    • a-SiC exhibits a higher refractive index and stronger nonlinearity than crystalline SiC.

    Conclusions:

    • Amorphous silicon carbide is a viable material for developing advanced photonic integrated circuits.
    • a-SiC offers a tunable platform with superior nonlinear optical performance and a wider bandgap compared to silicon.
    • This research paves the way for novel SiC-based photonic devices with minimized optical losses.