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Three-Dimensional Nanoscale Imaging of SiO2 Nanofiller in Styrene-Butadiene Rubber with High-Resolution and
Naru Okawa1,2,3, Nozomu Ishiguro1,3, Shuntaro Takazawa1,2,3
1International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University, 468-1 Aramaki-Aza-Aoba, Aoba-ku, Sendai 980-8572, Japan.
Abstract:
SiO2 aggregates in styrene-butadiene rubber (SBR) were observed using ptychographic X-ray computed tomography (PXCT). The rubber composites were illuminated with X-rays focused by total reflection focusing mirrors, and the ptychographic diffraction patterns were collected using a CITIUS detector in the range of -75° to +75° angle of incidence. The projection images of the rubber composites were reconstructed with a two-dimensional resolution of 76 nm, and no significant structural changes were observed during the PXCT measurements. A three-dimensional image of the rubber composite was reconstructed with an isotropic resolution of 98 nm. Segmentation of SiO2 from the SBR, based on a histogram analysis of the phase shift, revealed a fragmented network structure of interconnected SiO2 aggregates.
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