Characterization of Transition Edge Sensors for Decay Energy Spectrometry

Area of Science:

• Nuclear physics
• Materials science
• Sensor technology

Background:

• Decay energy spectrometry utilizes high-resolution energy measurements to identify radionuclides.
• Superconducting transition edge sensors (TES) offer precise thermal energy detection.
• Optimizing TES for alpha decay energy scales (MeV) is crucial for radionuclide analysis.

Purpose of the Study:

• To optimize thermal parameters of deep-etched silicon TES for MeV-scale alpha decay events.
• To investigate the thermal performance of silicon TES chips for radionuclide identification.
• To validate theoretical models of TES thermal behavior.

Main Methods:

• Utilized superconducting transition edge sensors (TES) for measuring thermal energy of decay events.
• Employed an onboard resistive heater to probe the thermal properties of deep-etched silicon TES chips.
• Calculated thermal conductance, heat capacity, and frame temperature based on heater power and bath temperature.

Main Results:

• Examined the thermal performance of deep-etched silicon TES chips.
• Calculated key thermal parameters including thermal conductance and heat capacity.
• Compared experimental thermal data with theoretical predictions.

Conclusions:

• Demonstrated the potential of TES for high-resolution radionuclide identification via alpha decay energy spectrometry.
• Provided insights into the thermal characteristics of silicon TES relevant for nuclear applications.
• Validated theoretical models against experimental measurements of TES thermal properties.