Improving EEG Forward Modeling Using High-Resolution Five-Layer BEM-FMM Head Models: Effect on Source Reconstruction

Guillermo Nuñez Ponasso1, William A Wartman1, Ryan C McSweeney1

  • 1Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, Worcester, MA 01609, USA.

PubMed
Summary

More complex models improve electroencephalographic (EEG) source localization accuracy. Five-layer boundary element models (BEM) with adaptive mesh refinement offer superior precision over simpler three-layer BEM for brain imaging applications.

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